Patterning microfluidic device wettability using flow confinement
Adam R. Abate, Julian Thiele, Marie Weinhart, David A. Weitz – 2010
We present a simple method to spatially pattern the surface properties of microfluidic devices using flow confinement. Our technique allows surface patterning with micron-scale resolution. To demonstrate its effectiveness, we use it to pattern wettability to form W/O/W and O/W/O double emulsions.