The AFM from JPK is a top-scanner controlled by a Linux workstation. The cantilever is mounted onto a glass block with an optical access from the top. With this setup it is possible to measure in liquids (water) as well as in air. Either tapping mode or quantitative analysis mode is available. The latter works with measuring force-distance curves and makes the analysis of mechanical properties possible. The automated table allows using scripts to plan experiments and make statistical analysis from different places. More specialized are the electrical modes, which require other tips or modules. Determination of work function or electrical inhomogeneities of suitable samples is possible.
Device specification: 30 µm × 30 µm scanner; XY-motorized stage, TopView Optic, Kelvin Probe and Conductive AFM module. AC mode and QI advanced mode are available.
The AFM is available in the clean room (1.2.12) of the AG Bolotin, FB Physik, Arnimallee 14. An introduction to clean room rules and an introduction to the AFM is mandatory.