Takudrei

198
Principal Component Analysis assisted Time of Flight Secondary Ion Mass Spectrometry: A Versatile Method for the Investigation of Self-Assembled Mono- and Multilayers as Precursors for the Bottom-up Approach of Nanoscaled Devices

M. Holzweber, T. Heinrich, V. Kunz, S. Richter, C. H.-H. Traulsen, C. A. Schalley, W. E. S. Unger— 2014

The production of high-quality self-assembled monolayers (SAMs) followed by Llayer-by-Llayer (LbL) self-assembly of macrocycles is essential for nanotechnology applications based on functional surface films. To help interpret of the large amount of data generated by a standard ToF-SIMS measurement, principal component analysis was used. For two examples, the advantages of a combination of ToF-SIMS and PCA for quality control and for the optimization of layer-by-layer self-assembly are shown. The first example investigates how different cleaning methods influence the quality of SAM template formation. The second example focuses on the layer-by-layer self-assembly of macrocycles and the corresponding stepwise surface modification.

Title198
Principal Component Analysis assisted Time of Flight Secondary Ion Mass Spectrometry: A Versatile Method for the Investigation of Self-Assembled Mono- and Multilayers as Precursors for the Bottom-up Approach of Nanoscaled Devices
AuthorM. Holzweber, T. Heinrich, V. Kunz, S. Richter, C. H.-H. Traulsen, C. A. Schalley, W. E. S. Unger
Date20140515
IdentifierDOI: 10.1021/ac500059a
Source(s)
CitationAnal Chem. 2014, 86, 5740-5748